显示 1-12 个结果(共 193 个结果)

Show sidebar
Close

2.7 Inch Portable Digital Microscope

2.7 Inch 544X Magnification 5MP Portable Digital Microscope 3.0 Mega Pixels (2048 X 1536) 5.0 Mega Pixels (2560 X 1920) Hardware Zoom: 17X magnification Smart Zoom TM: 8X (Applying) for magnifier mode Digital Zoom: 1.0X ~32X Total Enlarge image to 544X (17X32=544X)  
Close

45 digital head student’s microscope

Magnification:  40x  ~  400x Eyepiece:  WF10x  LCD  display Objective:  4x  10x  40X Head  tube:  Monocular  45  °  inclined  360  °  rotating  cylinder Lighting  system:  the  upper  and  lower  light  LED  light Working  distance:  27mm Coarse  movement  range:  13mm Working  area:  90mm  ×  90mm,  with  a  mobile  foot Condenser:  0.65  condenser,  pulling  plate  light  bar
Close

98JB Precision measuring projector (digital display type)

98JB Precision measuring projector (digital display type) Precision measuring projector (digital display type) 98JB main advantages are: structural stability, the use of telecentric optical path, using fiber-optic lighting makes more evenly bright, and can be measured in different parts of the brightness adjustment to eliminate the focusing error caused by measurement error. Convenient for operation and maintenance of aircraft, high efficiency and applicability. At present, projector 98JB precision measurement standards has been widely used measures, clocks and watches, synthetic textiles, precious stones bearings, instrument components and many other needs of the industry measurement of micro-projector.
Close

9J Light-section microscope

9J Light-section microscope              Digital Photography Light-section Microscope 9J-V Use: The apparatus is based on measurement of light-section method of micro-machining the surface roughness. For surface scratches, groove or the depth of defects can also be used to carry out measurements. Characterized by light-section method without damaging the surface under the condition. Is a kind of indirect measurement method. That is, to go through can only be determined after calculating the trace of the roughness profile. The apparatus with a digital camera that is upgraded to digital photography Microscope light-section method. Specification: Uneven depth measurement range: 0.8~80μm(▽3~▽9) Uneven width    Eyepiece with micrometer     0.7μm~2.5mm Table with the coordinate   0.01~13mm Total magnifcation  60×/120×/260×/510× Net Weight: 23kg Dimension: 180×290×470mm
Close

A-25i multi-viewing microscope

A-25i multi-viewing microscope  five head, three head or dual head multi-viewing microscope for major microscope specification, you can refer to A-2I biological microscope Specification:
  1. UCIS Infinity Independent Achromatic Optical System
  2. WF10x20 Plan Eyepieces
  3. 52-75mm 48-75mm Interpupillary Distance Settings, ±5 Diopter Adjustment
  4. Quadruple Nosepiece Inward Facing with Positive Click Stops
  5. Infinity Plan Achromatic 4x, 10x, 40x(S) and 100x (S/Oil) Objectives
  6. Right Hand Controls, Low Position, Mechanical Stage, 142mm x 135mm, Movement Range 76mm x 52mm
  7. Coaxial Coarse and Fine Focus Mechanism with Markings on Knobs. Fine Focus Sensitivity 0.001mm
  8. 6v 20w Halogen or 3W LED Illumination, 110-240V Wide Voltage
  9. Dust Cover, Clear Blue Filter, Power Cord, Immersion Oil
Close

Abbe Refractometer

Abbe Refractometer Measurement of transparent and translucent liquids or solids and the average of the refractive index ND dispersion NF-NC. Equipment can also be received with thermostat, to determination of the temperature 0 ℃ -70 ℃ for the refractive index of ND, and measured the volume of sugar solution concentration in percentage of sugar content.
Close

AG-1 serials jewelry microscope

7×~45×, working distance: 95mm super wide-field eyepiece 10×/23mm adjustable interpupillary range: 55~75mm.
Close

BJ portable metallurgical microscope

MIC TECH BJ-A/BJ-B model is a portable metallurgical microscope, but a little bit different. When metal and alloy which needs to be distinguished but unable to make samples to be used in the on-the-spot material is appraised live, this machine can carry on analysis and research on the metal material in the metallographic testing, and the analytic work of metallographic. It can also be applied to jade article, pottery, bronze ware surface observation of institutional framework analysis. This instrument adopts LED to light vertically, does not need 220V alternating current source, uses lightly and safely for users, hours continuously lighting, long service time. The LED light rises warmly. Very small in size, low heat for safe use. This instrument can dispose CCD digital camera, digital camera, but convenient picture gathered, kept, imported at the scene is analyzed and researched.
Close

GEM-1 jewelry microscope

Jewelry microscope Stereo zoom 6.5-45X(90) Zoom ratio l:7 Working distance:103mm
Close

GEM-2 jewelry microscope

Stereo Zoom range 10-80(120X) Zoom ratio l:4 Working distance:95mm The range for adjusting the visual distance:55-75mm The range for adjusting the diopter: 士5 The range for adjuring the focus: 50mm Two kinds of illumination fields Adjustment light source
Close

HG serials jewelry microscope

0.75X~5X 0.7X~3.6X 1X-4X 2X/4X 1X/3X 1X/2X 2X HG serials Jewelry microscope is professional instrument, which is suitable for jewelry shop ,jewelry processing center, jewelry and jade inspection center and for observe and appraise of jewelry ,emerald & jade .The excellent optical system and various illumination system to ensure better viewing effect. The reasonable operation structure can lighten operator's tiredness but improve the working efficiency. The multi-functional accessory can meet with various requirements
Close

ICM-1000M tool microscope manual

Tool microscope for inspections ■ The stable and reliable operating mechanism provide clearer image and easier to operate. ■ Modulate microscope body with a new ergonomic design, structural symmetry, can used with many kinds of accessories. ■ Stage, light intensity and low position coarse and fine adjustment, increased comfort of operating. ■ Widely used in various types of semi-conductor silicon wafer inspection, materials science study, geology mineral analysis and precision engineering and other disciplines